UCSB SoC Design and Test Lab

Welcome to UCSB SoC design and test lab! This lab was founded by Professor Kwang-Ting (Tim) Cheng in 1993. We focus on developing methodologies, algorithms, techniques, and tools for validating, verifying, testing, and synthesizing deep sub-micron (DSM) system-on-chip (SoC) devices as well as flexible electronics.

News and Announcements

Date 2013

Nicole will be at the Design, Automation, and Test in Europe (DATE) conference in Grenoble, France, to present our recent work on Coverage Discounting.

Posted: Tuesday, February 11, 2014 - 11:46

ITC 2013

Amirali, Miguel, Fan-Lin, and Chun-Kai will be at the International Test Conference in Anaheim to present our recent works on memristor reliability and Test Data Analytics.

Posted: Tuesday, February 11, 2014 - 11:38

ITC 2011 Best Student Paper Award

Congratulations to Saeed and Amirali for winning the best student paper award for their paper "End-to-end error correction and online diagnosis for on-chip networks" in International Test Conference 2011.

Posted: Thursday, September 20, 2012 - 14:02

DAC Workshop on More Than Moore Technologies

Peter and Yan presented our recent work in on-chip optical interconnect at the Design Automation Conference workshop on More Than Moore Technologies in San Francisco.

Posted: Friday, June 8, 2012 - 11:23

Peter Lisherness's Ph.D. Defense

Congratulations to Peter on defending his Ph.D. thesis: "Improving Validation Coverage Metrics to Account for Limited Observability".

Posted: Friday, June 8, 2012 - 10:47

Ming Gao's Ph.D. Defense

Congratulations to Ming on defending his Ph.D. thesis: "Cost Effective Error Detection for SoC Validation and Online Testing".

Posted: Tuesday, May 1, 2012 - 17:07

VTS 2012

Amirali will be at the VLSI Test Symposium in Maui to present our recent work in defect diagnosis in NoC.

Posted: Tuesday, April 17, 2012 - 16:46

DATE 2012

Our visiting scholar Yan Zheng will be at DATE in Dresden to present our recent work in on-chip optical communications.

Posted: Friday, March 9, 2012 - 17:27

ASP-DAC 2012

Prof. Cheng and Peter will be at the Asia and South Pacific Design Automation Conference (ASP-DAC) in Sydney to present one invited and two regular papers.

Improving Validation Coverage Metrics to Account for Limited Observability
Post-Fabrication Reconfiguration for Power-Optimized Tuning of Optically Connected Multi-Core Systems
On Error Modeling of Electrical Bugs for Post-Silicon Timing Validation

Posted: Monday, January 23, 2012 - 15:55

GSRC Annual Review

Prof. Cheng, Ming, and Amirali will present research updates at the GSRC annual review November 16-17, 2011.

Posted: Monday, November 7, 2011 - 11:54

Recent Publications

Athermal Characteristics of TiO2-Clad Silicon Waveguides at 1.3µm

Feng, S., K. Shang, J. Bovington, R. Wu, K-T. Cheng, J. E. Bowers, and S.J.. Ben Yoo, "Athermal Characteristics of TiO2-Clad Silicon Waveguides at 1.3µm", International Photonics Conference (IPC), San Diego, CA, 10/2014.

Energy-Efficient GPGPU Architectures via Collaborative Compilation and Memristive Memory-Based Computing

Rahimi, A., A. Ghofrani, M. Lastras, K-T. Cheng, R. Gupta, and L. Benini, "Energy-Efficient GPGPU Architectures via Collaborative Compilation and Memristive Memory-Based Computing", Design Automation Conference (DAC), San Francisco, California, 06/2014.

DAC14.pdf

Joint Virtual Probe: Joint Exploration of Multiple Test Items’ Spatial Patterns for Efficient Silicon Characterization and Test Prediction

Zhang, S., F. Lin, C-K. Hsu, K-T. Cheng, and H. Wang, "Joint Virtual Probe: Joint Exploration of Multiple Test Items’ Spatial Patterns for Efficient Silicon Characterization and Test Prediction", Design, Automation, and Test in Europe (DATE), Dresden, Germany, 03/2014.

DATE14.pdf

Thermal stress implications in athermal TiO2 waveguides on a silicon substrate

Bovington, J., R. Wu, K-T. Cheng, and J. E. Bowers, "Thermal stress implications in athermal TiO2 waveguides on a silicon substrate", Optics Express, vol. 22, issue 1, pp. 661-666, 01/2014.

OE14.pdf

Test Data Analytics - Exploring Spatial and Test-Item Correlations in Production Test Data

Hsu, C-K., F. Lin, K-T. Cheng, W. Zhang, X. Li, J C. M. Jr., and K. M. Butler, "Test Data Analytics - Exploring Spatial and Test-Item Correlations in Production Test Data", International Test Conference (ITC), Anaheim, IEEE, 09/2013.

ITC13-2.pdf

Towards Data Reliable Crossbar-Based Memristive Memories

Ghofrani, A., M. Lastras, and K-T. Cheng, "Towards Data Reliable Crossbar-Based Memristive Memories", International Test Conference (ITC), Anaheim, IEEE, 09/2013.

ITC13.pdf

Coverage Discounting: Improved Testbench Qualification by Combining Mutation Analysis with Functional Coverage

Lesperance, N., P. Lisherness, and K-T. Cheng, "Coverage Discounting: Improved Testbench Qualification by Combining Mutation Analysis with Functional Coverage", SRC TechCon, Austin, TX, 09/2013.

TECHCON13.pdf

Test-Quality Optimization for Variable n-Detections of Transition Faults

Xu, D., H. Li, A. Ghofrani, K-T. Cheng, Y. Han, and X. Li, "Test-Quality Optimization for Variable n-Detections of Transition Faults", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. PP, issue 99, 07/2013.

Main menu