Biblio

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D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., “Test-Quality Optimization for Variable n -Detections of Transition Faults”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.
D. Xiang, Sui, W., Yin, B., and Cheng, K. - T. Tim, “Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1968-1979, 2014.
D. Xiang, Yin, B., and Cheng, K. - T. Tim, “Dynamic test compaction for transition faults in broadside scan testing based on an influence cone measure”, in VLSI Test Symposium, 2009. VTS'09. 27th IEEE, 2009.