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S. Mirzaeian, Zheng, F., and Cheng, K. - T. Tim, RTL error diagnosis using a word-level SAT-solver, in Test Conference, 2008. ITC 2008. IEEE International, 2008.
S. - J. Pan, Cheng, K. - T. Tim, Moondanos, J., and Hanna, Z., Generation of shorter sequences for high resolution error diagnosis using sequential sat, in Proceedings of the 2006 Asia and South Pacific Design Automation Conference, 2006, pp. 25–29.
K. Roy, Mak, T. M., and Cheng, K. - T. Tim, Test consideration for nanometer-scale CMOS circuits, Design & Test of Computers, IEEE, vol. 23, pp. 128–136, 2006.