Keywords

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$n$ -detection test (1) 1-n detection (1) 12-bit memories (1)
16-bit memories (1) 24-bit memories (1) 3D IC (1)
3D integrated design (1) 8-bit memories (1) accelerated fault simulation (1)
Access-Transistor-Free (1) Accuracy (3) Adaptive Write Scheme (1)
ADC (1) ADC testing (1) AES design (1)
all-digital built-in self-test (1) all-digital built-in self-test technique (1) AMM module (1)
analog-to-digital conversion (1) analog-to-digital converters (1) analogue-digital conversion (2)
analysis (1) Application specific integrated circuits (1) application-aware testing (1)
application-specific profile feedback (1) Approximate computing (1) approximate longest sensitized path metric (1)
Arrays (1) ASIC implementation (1) Assertion checker (1)
associative memory (1) associative memristive memory module (1) asymmetric voltages (1)
at-speed testing (1) ATF memristive crossbar scalability (1) athermal characteristics (1)
athermal waveguide design (1) automated diagnosis (1) automatic test pattern generation (2)
automatic test pattern generation circuit model (1) automatic test pattern generation tool (1) bang-bang phase-frequency detector (1)
BCH codes (1) Benchmark testing (1) BIST (1)
built-in postfabrication tunability (1) built-in self test (2) Built-in self-test (2)
C models (1) C++ language (1) C++ models (1)
calibration (2) calibration circuitry (1) canonical analysis (1)
chip area overhead reduction (1) chip test measurement (1) CHStone C high-level-synthesis benchmark set (1)
Circuit faults (2) Circuit optimization (1) circuit reliability (1)
Circuit simulation (1) Circuit testing (3) circuit yield (1)
Clocks (1) CMOS integrated circuits (3) CMOS technology (1)
Collaboration (1) collaborative compilation (1) Communication channels (1)
compact test generation (1) Compaction (1) compiler (1)
complex chips (1) Computer architecture (2) Computer bugs (1)
Computer industry (1) conflict avoidance (1) controllability metrics (1)
Correlation (4) correlation exploration (1) cost (1)
cost reduction (1) cost-sensitive electronic products (1) costing (1)
Costs (3) coverage (1) coverage metrics (1)
Crossbar (1) crossbar-based memristor arrays (1) cryptographic hardware (1)
cryptography (1) DAC (1) Data analysis (2)
data reliability (1) data reliability problems (1) data reliable crossbar-based memristive memories (1)
Debugging (2) decoding (2) defect screening (1)
Delay (2) Delays (2) Design engineering (1)
design flow (1) Design for debug (1) Design for disassembly (1)
Design for testability (2) design modifications (1) design style (1)
design-for-debug technique (1) device characteristics (1) device under test (1)
DfD technique (1) die (1) Digital calibration (1)
Digital circuits (1) digital signal processing chips (1) digital-analogue conversion (1)
digital-to-analog conversion (1) digitally-assisted analog circuits (1) Digitally-assisted testing (1)
digitally-calibrated ADC (1) Discrete cosine transforms (2) disturbance confinement (1)
disturbance detection (1) dynamic power overhead reduction (1) dynamic test compaction (1)
effective-number of bits (1) efficient silicon characterization (1) eFPGA core (1)
Electrical products industry (1) electron probes (1) Electronic equipment testing (2)
electronic systems (1) elemental semiconductors (3) embedded field programmable gate array (1)
embedded FPGA (1) embedded FPGA block (1) energy conservation (1)
energy consumption (1) Energy efficiency (1) energy saving (1)
energy use (1) energy-efficiency techniques (1) energy-efficient GPGPU architecture (1)
equalization-based calibration scheme (1) Equations (2) error correction (1)
error correction codes (1) error detection (1) error injection tools (1)
error tolerance (1) error transfer function (1) error-locality-aware codes (1)
error-locality-aware linear coding (1) Estimation (1) exhaustive testing (1)
fault coverage (1) Fault detection (3) fault diagnosis (2)
fault simulation (1) faulty design module (1) faulty timing behavior (1)
feature engineering (2) Feature extraction (1) feature transformation (1)
field programmable gate arrays (3) flexible electronic design style (1) flexible electronics (3)
Flexible printed circuits (1) floating point units (1) floating point units (FPUs) (1)
FPU (1) Frequency modulation (1) frequency modulator (1)
frequency synthesizer (1) GCC compiler (1) General public utilities (GPU) (1)
general public utility (1) general purpose graphics processing unit (1) Genetic mutations (1)
Glass (1) global error (1) Golay codes (1)
GPGPUs (1) GPU architecture parallelism (1) GPU-based fault simulator (1)
graphics processing units (2) graphics processing units (GPUs) (1) H.264 decoder (2)
hard-to-detect bug (1) Hardware (5) High level synthesis (1)
high-level synthesis (1) high-volume industrial device (1) Hopfield neural nets (1)
Hopfield neural network (1) Hopfield neural network circuit (1) Hopfield neural networks (1)
hybrid circuit (1) hybrid circuits (1) image sensor (1)
in-field failure (1) in-field failure rates (1) in-field testing (1)
Indexes (1) indium compounds (2) industrial products (1)
InGaZnO (2) injected error detection (1) inner links (1)
integrated circuit design (5) Integrated circuit measurements (1) Integrated circuit modeling (1)
integrated circuit reliability (5) Integrated circuit synthesis (1) integrated circuit testing (7)
integrated circuit yield (2) integrated memory circuits (1) integrated optics (2)
inter-test-item correlations (1) interface routing (1) intertest item correlations (1)
intertest-item correlations (1) Inverters (1) joint exploration (1)
joint virtual probe (1) Joints (1) JVP implicit use (1)
k-bit subspaces (1) Kernel (1) kernel execution (1)
large-scale access-transistor-free memristive crossbar (1) launch-on-capture (LOC) delay testing (1) launch-on-capture scan testing (1)
launch-on-capture transition fault testing (1) Leakage currents (1) Leakage-Current Filtering (1)
Least-mean-squared (LMS) adaptation algorithm (1) life time resiliency (1) linear codes (1)
Logic devices (1) Logic gates (4) logic testing (3)
longest sensitized path (1) low computational complexity (1) low overhead time-multiplexed online checking (1)
low-cost electronics (1) low-cost resilience (1) low-cost substrate (1)
low-power (2) low-power electronics (3) low-power memory (1)
malicious circuitry (1) Manuals (1) Manufacturing (1)
manufacturing defect (1) Manufacturing processes (2) manufacturing test (1)
manufacturing testing (1) March Algorithm (1) Mathematical model (2)
measurement values (1) memory access (2) Memory Testing (1)
memory usage optimization (1) memory-based computing (1) Memristive Crossbar (1)
memristive memory-based computing (1) memristor (5) memristor circuits (1)
memristors (4) mesh based NoC (1) metal oxide memristors (1)
microarchitectural design (1) microprocessor chips (1) mixed analogue-digital integrated circuits (1)
mixed-signal circuit (1) Mixed-signal testing (1) mono type thin film transistors (1)
multibit upsets (1) Multicore processing (1) multiple test items (1)
mutation (1) mutation injection tool (1) n-detection fault simulation (1)
n-detection test (1) Nanoscale devices (1) Nanowires (1)
network analysis (1) Network-on-a-chip (1) network-on-chip (1)
Neurons (1) nGFSIM (1) NoC (1)
Noise (2) non-uniform spare distributtion (1) Nonvolatile (1)
numerical analysis (1) numerical simulation (1) Observability (1)
observability metrics (1) offset errors (1) on-chip reconfigurable block (1)
on-chip stimulus synthesis (1) Online ResistanceMonitoring (1) online testing (1)
op-amp (1) operational amplifier (1) optical design techniques (1)
optical resonators (1) Optical ring resonators (1) Optical waveguides (2)
organic semiconductors (2) organic TFT (1) Organic thin film transistors (2)
OSCI SystemC example models (1) outer links (1) parallel architectures (1)
parallel test selection method (1) parametric test items (1) parasitic effect (1)
partially-selected device (1) Partitioning algorithms (1) per-cell access-transistor (1)
Permission (1) Phase frequency detector (1) phase locked loops (1)
physical defects (1) physical measurement (1) Pipelines (1)
plaintext bits (1) Plastics (2) platinum (1)
PLL (1) PLL architectures (1) plugin interface (1)
post fabrication tuning (1) post-silicon bug detection (1) post-silicon bug isolation (1)
post-silicon debugging (1) post-silicon hardware trojan detection (1) Post-silicon validation (2)
power aware computing (1) Predictive models (1) Principal component analysis (1)
Production (2) production engineering (1) production test data (3)
production test programs (1) production test strategy (1) production testing (1)
program compilers (2) program diagnostics (1) program verification (1)
Programmable logic arrays (2) Protocols (1) pseudo CMOS (1)
pseudo-CMOS (1) Pt-TiO2-x-Pt (1) quality analysis (1)
quality assurance (1) quality assurance technique (1) quality constraint (1)
quality metric (1) Radio frequency (1) radiofrequency integrated circuits (1)
random-access storage (1) Redundancy (2) Registers (1)
regression analysis (1) reliability (3) reliability simulation (1)
ReRAM (3) Research and development (1) Resistance (2)
resistive switching devices (1) resonance shift (1) response analysis (1)
RF circuit (1) RFID tags (1) ring resonance wavelengths (1)
ring resonators (1) robust circuit/system design (1) robust flexible electronics (1)
Robustness (1) Runtime (2) runtime reduction (1)
SAT-solver (1) SCEMIT (1) screen potential test escape (1)
second-order effects (1) second-order thermo-optical effects (1) security (1)
Semiconductor device measurement (3) Semiconductor device modeling (1) semiconductor technology (1)
Sensitivity (1) Sensors (1) sequential backtracing scheme (1)
Si (3) sigma-delta fractional-N RF PLLs (1) Silicon (4)
silicon debugging (1) Silicon photonics (1) silicon substrate (1)
single-bit upset (1) single-run fault simulation (1) small delay defect (1)
SoC (1) Sociology (1) Software algorithms (1)
software metrics (1) spare programmable core (1) spare wires (1)
spare-enhanced multi-core chip subject (1) spatial correlations (1) spatial item correlations (1)
spatial pattern (1) spatial patterns (1) spatial variations (1)
spatiotemporal reuse (1) spectral dependency (1) SRAM (1)
SRAM chips (1) SRAM memory (1) standard cell (1)
static gain (1) statistical analysis (1) statistical regression method (1)
statistical regression tools (1) statistical test (1) statistical testing (1)
steady-state fluctuation (1) storage management chips (1) Stress (1)
stuck-at faults (1) Substrates (2) Switches (2)
syndrome analysis (1) System analysis and design (1) System recovery (1)
System testing (1) system-on-chip (2) SystemC (1)
SystemC error (1) Telecommunication network reliability (1) temperature 20 degC to 50 degC (1)
Temperature measurement (2) temporal correlations (1) ternary content-addressable memory (TCAM) (1)
test circuitry (1) test cost reduction (1) test data analytics (1)
test data compression (1) test prediction (1) test program (1)
test quality improvement (1) test quality optimization (1) test response compaction (1)
test response compaction. (1) test selection (1) test time reduction (1)
Testing (2) TFT technology (1) TFT-LCD displays (1)
Thermal degradation (1) thermal stress (1) thermal stresses (1)
thermo-optical effects (2) thermo-stress-optic behavior (1) thin film circuits (1)
thin film transistor (1) thin film transistors (3) three-dimensional integrated circuits (1)
time division multiplexing (1) time-multiplexed (2) time-multiplexed assertion checking (1)
Timing (2) timing aware test selection method (1) timing errors (1)
timing sensitivity (1) TiO2-clad silicon waveguides (1) TiO2-Si (2)
titanium compounds (3) TMAC implementation (1) TMOC checker (1)
Topology (1) Training (1) transfer function characterization (1)
transfer functions (1) Transistors (1) transition fault (TF) (1)
transition fault (TF). (1) transition fault detection (2) triple-error-correcting Golay code (1)
Trojan horses (2) TV (1) ultra-low power computing (1)
ultradense memory system (1) ultrahigh-density (1) Variation-Aware Design (1)
variations (1) Vectors (4) verification effort (1)
Very large scale integration (1) video coding (1) virtual probe (1)
Voltage measurement (2) voltage overscaling (2) wafer (1)
wavelength 1.3 mum (1) Wavelength measurement (1) weighted group lasso (1)
weighted optimization problem (1) Wires (1) word length 4 bit (1)
word length 6 bit (1) yield and cost modeling (1) yield enhancement (1)