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| accelerated fault simulation (1) | Access-Transistor-Free (1) | Accuracy (3) |
| Adaptive Write Scheme (1) | ADC (1) | ADC testing (1) |
| AES design (1) | all-digital built-in self-test (1) | all-digital built-in self-test technique (1) |
| AMM module (1) | analog-to-digital conversion (1) | analog-to-digital converters (1) |
| analogue-digital conversion (2) | analysis (1) | Application specific integrated circuits (1) |
| application-aware testing (1) | application-specific profile feedback (1) | Approximate computing (1) |
| approximate longest sensitized path metric (1) | Arrays (1) | ASIC implementation (1) |
| Assertion checker (1) | associative memory (1) | associative memristive memory module (1) |
| asymmetric voltages (1) | at-speed testing (1) | ATF memristive crossbar scalability (1) |
| athermal characteristics (1) | athermal waveguide design (1) | automated diagnosis (1) |
| automatic test pattern generation (2) | automatic test pattern generation circuit model (1) | automatic test pattern generation tool (1) |
