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accelerated fault simulation (1) Access-Transistor-Free (1) Accuracy (3)
Adaptive Write Scheme (1) ADC (1) ADC testing (1)
AES design (1) all-digital built-in self-test (1) all-digital built-in self-test technique (1)
AMM module (1) analog-to-digital conversion (1) analog-to-digital converters (1)
analogue-digital conversion (2) analysis (1) Application specific integrated circuits (1)
application-aware testing (1) application-specific profile feedback (1) Approximate computing (1)
approximate longest sensitized path metric (1) Arrays (1) ASIC implementation (1)
Assertion checker (1) associative memory (1) associative memristive memory module (1)
asymmetric voltages (1) at-speed testing (1) ATF memristive crossbar scalability (1)
athermal characteristics (1) athermal waveguide design (1) automated diagnosis (1)
automatic test pattern generation (2) automatic test pattern generation circuit model (1) automatic test pattern generation tool (1)

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