|
| DAC (1) | Data analysis (2) | data reliability (1) |
| data reliability problems (1) | data reliable crossbar-based memristive memories (1) | Debugging (2) |
| decoding (2) | defect screening (1) | Delay (2) |
| Delays (2) | Design engineering (1) | design flow (1) |
| Design for debug (1) | Design for disassembly (1) | Design for testability (2) |
| design modifications (1) | design style (1) | design-for-debug technique (1) |
| device characteristics (1) | device under test (1) | DfD technique (1) |
| die (1) | Digital calibration (1) | Digital circuits (1) |
| digital signal processing chips (1) | digital-analogue conversion (1) | digital-to-analog conversion (1) |
| digitally-assisted analog circuits (1) | Digitally-assisted testing (1) | digitally-calibrated ADC (1) |
| Discrete cosine transforms (2) | disturbance confinement (1) | disturbance detection (1) |
| dynamic power overhead reduction (1) | dynamic test compaction (1) | |
