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Home ยป Biblio

Keywords

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
DAC (1) Data analysis (2) data reliability (1)
data reliability problems (1) data reliable crossbar-based memristive memories (1) Debugging (2)
decoding (2) defect screening (1) Delay (2)
Delays (2) Design engineering (1) design flow (1)
Design for debug (1) Design for disassembly (1) Design for testability (2)
design modifications (1) design style (1) design-for-debug technique (1)
device characteristics (1) device under test (1) DfD technique (1)
die (1) Digital calibration (1) Digital circuits (1)
digital signal processing chips (1) digital-analogue conversion (1) digital-to-analog conversion (1)
digitally-assisted analog circuits (1) Digitally-assisted testing (1) digitally-calibrated ADC (1)
Discrete cosine transforms (2) disturbance confinement (1) disturbance detection (1)
dynamic power overhead reduction (1) dynamic test compaction (1)

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