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| parallel architectures (1) | parallel test selection method (1) | parametric test items (1) |
| parasitic effect (1) | partially-selected device (1) | Partitioning algorithms (1) |
| per-cell access-transistor (1) | Permission (1) | Phase frequency detector (1) |
| phase locked loops (1) | physical defects (1) | physical measurement (1) |
| Pipelines (1) | plaintext bits (1) | Plastics (2) |
| platinum (1) | PLL (1) | PLL architectures (1) |
| plugin interface (1) | post fabrication tuning (1) | post-silicon bug detection (1) |
| post-silicon bug isolation (1) | post-silicon debugging (1) | post-silicon hardware trojan detection (1) |
| Post-silicon validation (2) | power aware computing (1) | Predictive models (1) |
| Principal component analysis (1) | Production (2) | production engineering (1) |
| production test data (3) | production test programs (1) | production test strategy (1) |
| production testing (1) | program compilers (2) | program diagnostics (1) |
| program verification (1) | Programmable logic arrays (2) | Protocols (1) |
| pseudo CMOS (1) | pseudo-CMOS (1) | Pt-TiO2-x-Pt (1) |
