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Keywords

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parallel architectures (1) parallel test selection method (1) parametric test items (1)
parasitic effect (1) partially-selected device (1) Partitioning algorithms (1)
per-cell access-transistor (1) Permission (1) Phase frequency detector (1)
phase locked loops (1) physical defects (1) physical measurement (1)
Pipelines (1) plaintext bits (1) Plastics (2)
platinum (1) PLL (1) PLL architectures (1)
plugin interface (1) post fabrication tuning (1) post-silicon bug detection (1)
post-silicon bug isolation (1) post-silicon debugging (1) post-silicon hardware trojan detection (1)
Post-silicon validation (2) power aware computing (1) Predictive models (1)
Principal component analysis (1) Production (2) production engineering (1)
production test data (3) production test programs (1) production test strategy (1)
production testing (1) program compilers (2) program diagnostics (1)
program verification (1) Programmable logic arrays (2) Protocols (1)
pseudo CMOS (1) pseudo-CMOS (1) Pt-TiO2-x-Pt (1)

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