Skip to main content
Home
UCSB SoC Design and Test Lab

Search form

Main menu

  • Home
  • Members
  • Publications
  • Courses
  • Current Projects

You are here

Home ยป Biblio

Keywords

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
SAT-solver (1) SCEMIT (1) screen potential test escape (1)
second-order effects (1) second-order thermo-optical effects (1) security (1)
Semiconductor device measurement (3) Semiconductor device modeling (1) semiconductor technology (1)
Sensitivity (1) Sensors (1) sequential backtracing scheme (1)
Si (3) sigma-delta fractional-N RF PLLs (1) Silicon (4)
silicon debugging (1) Silicon photonics (1) silicon substrate (1)
single-bit upset (1) single-run fault simulation (1) small delay defect (1)
SoC (1) Sociology (1) Software algorithms (1)
software metrics (1) spare programmable core (1) spare wires (1)
spare-enhanced multi-core chip subject (1) spatial correlations (1) spatial item correlations (1)
spatial pattern (1) spatial patterns (1) spatial variations (1)
spatiotemporal reuse (1) spectral dependency (1) SRAM (1)
SRAM chips (1) SRAM memory (1) standard cell (1)
static gain (1) statistical analysis (1) statistical regression method (1)
statistical regression tools (1) statistical test (1) statistical testing (1)
steady-state fluctuation (1) storage management chips (1) Stress (1)
stuck-at faults (1) Substrates (2) Switches (2)
syndrome analysis (1) System analysis and design (1) System recovery (1)
System testing (1) system-on-chip (2) SystemC (1)
SystemC error (1)

User login

  • Request new password

Navigation

  • Biblio
    • Authors
    • Keywords
Powered by Drupal