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Telecommunication network reliability (1) temperature 20 degC to 50 degC (1) Temperature measurement (2)
temporal correlations (1) ternary content-addressable memory (TCAM) (1) test circuitry (1)
test cost reduction (1) test data analytics (1) test data compression (1)
test prediction (1) test program (1) test quality improvement (1)
test quality optimization (1) test response compaction (1) test response compaction. (1)
test selection (1) test time reduction (1) Testing (2)
TFT technology (1) TFT-LCD displays (1) Thermal degradation (1)
thermal stress (1) thermal stresses (1) thermo-optical effects (2)
thermo-stress-optic behavior (1) thin film circuits (1) thin film transistor (1)
thin film transistors (3) three-dimensional integrated circuits (1) time division multiplexing (1)
time-multiplexed (2) time-multiplexed assertion checking (1) Timing (2)
timing aware test selection method (1) timing errors (1) timing sensitivity (1)
TiO2-clad silicon waveguides (1) TiO2-Si (2) titanium compounds (3)
TMAC implementation (1) TMOC checker (1) Topology (1)
Training (1) transfer function characterization (1) transfer functions (1)
Transistors (1) transition fault (TF) (1) transition fault (TF). (1)
transition fault detection (2) triple-error-correcting Golay code (1) Trojan horses (2)
TV (1)

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