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M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Post-silicon Bug Detection for Variation Induced Electrical Bugs, in Proceedings of the 16th Asia and South Pacific Design Automation Conference, Piscataway, NJ, USA, 2011.
M. Gao, Chang, H. - M. Sherman, Lisherness, P., and Cheng, K. - T. Tim, Time-multiplexed online checking, Computers, IEEE Transactions on, vol. 60, pp. 1300–1312, 2011.
M. Gao and Cheng, K. - T. Tim, A case study of Time-Multiplexed Assertion Checking for post-silicon debugging, in High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International, 2010.