Biblio

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Author [ Year(Asc)]
Filters: Author is Lisherness, Peter  [Clear All Filters]
2013
P. Lisherness, Lesperance, N., and Cheng, K. - T. Tim, Mutation analysis with coverage discounting, in Design, Automation Test in Europe Conference (DATE), 2013. DATE13.pdf (167.64 KB)
2012
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Adaptive test selection for post-silicon timing validation: A data mining approach, in Test Conference (ITC), 2012 IEEE International, 2012.
M. Gao, Lisherness, P., Cheng, K. - T. Tim, and Liou, J. - J., On error modeling of electrical bugs for post-silicon timing validation, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
P. Lisherness and Cheng, K. - T. Tim, Improving validation coverage metrics to account for limited observability, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
Y. Zheng, Lisherness, P., Shamshiri, S., Ghofrani, A., Yang, S., and Cheng, K. - T. Tim, Post-fabrication reconfiguration for power-optimized tuning of optically connected multi-core systems, in Design Automation Conference (ASP-DAC), Asia and South Pacific, 2012. ASPDAC2012_optical.pdf (221.18 KB)
Y. Zheng, Lisherness, P., Gao, M., Bovington, J., Yang, S., and Cheng, K. - T. Tim, Power-efficient calibration and reconfiguration for on-chip optical communication, in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012. DATE2012_optical.pdf (341.67 KB)
Y. Zheng, Lisherness, P., Gao, M., Bovington, J., Cheng, K. - T., Wang, H., and Yang, S., Power-efficient calibration and reconfiguration for optical network-on-chip, Journal of Optical Communications and Networking, vol. 4, pp. 955–966, 2012. JOCN2012.pdf (1.49 MB)
2011
P. Lisherness and Cheng, K. - T. Tim, Coverage discounting: A generalized approach for testbench qualification, in High Level Design Validation and Test Workshop (HLDVT), 2011 IEEE International, 2011.
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Post-silicon Bug Detection for Variation Induced Electrical Bugs, in Proceedings of the 16th Asia and South Pacific Design Automation Conference, Piscataway, NJ, USA, 2011.
M. Gao, Chang, H. - M. Sherman, Lisherness, P., and Cheng, K. - T. Tim, Time-multiplexed online checking, Computers, IEEE Transactions on, vol. 60, pp. 1300–1312, 2011.
2010
P. Lisherness and Cheng, K. - T. Tim, SCEMIT: A SystemC error and mutation injection tool, in Design Automation Conference (DAC), 2010 47th ACM/IEEE, 2010.
2009
P. Lisherness and Cheng, K. - T. Tim, An instrumented observability coverage method for system validation, in High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International, 2009.