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P. Lisherness, Lesperance, N., and Cheng, K. - T. Tim, Mutation analysis with coverage discounting, in Design, Automation Test in Europe Conference (DATE), 2013.PDF icon DATE13.pdf (167.64 KB)
M. Gao and Cheng, K. - T. Tim, A case study of Time-Multiplexed Assertion Checking for post-silicon debugging, in High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International, 2010.