Biblio

Export 151 results:
Author [ Year(Asc)]
2015
M. Payvand, Madhavan, A., Lastras-Montano, M. Angel, Ghofrani, A., Rofeh, J., Cheng, K. - T. Tim, Strukov, D., and Theogarajan, L., A Configurable CMOS Memory Platform for 3D Integrated Memristors, in International Symposium on Circuits and Systems , Lisbon, Portugal, 2015. ISCAS15.pdf (714.06 KB)
T. - C. Huang, Huang, J. - L., and Cheng, K. - T., Design, Automation, and Test for Low-Power and Reliable Flexible Electronics, Foundations and Trends in Electronic Design Automation, vol. 9, pp. 99-210, 2015.
N. Fern and Cheng, K. - T. Tim, Detecting Hardware Trojans in Unspecified Functionality Using Mutation Testing, in International Conference on Computer Aided Design (ICCAD), 2015. ICCAD15.pdf (382.74 KB)
T. - C. Huang, Li, C., Wu, R., Chen, C. - H., Fiorentino, M., Cheng, K. - T., Palermo, S., and Beausoleil, R. G., DWDM Nanophotonic Interconnects: Toward Terabit/s Chip-Scale Serial Link, in International Midwest Symposium on Circuits and Systems (MWSCAS), Fort Collins, Colorado, 2015. DWDM_nanophotnic link_JimHuang_camera_ready.pdf (1.23 MB)
N. Lesperance, Kulkarni, S., and Cheng, K. - T. Tim, Hardware Trojan Detection Using Exhaustive Testing of k-bit Subspaces, in Asia and South Pacific Design Automation Conference (ASP-DAC), 2015. ASPDAC2015.pdf (508.45 KB)
N. Fern, Kulkarni, S., and Cheng, K. - T. Tim, Hardware Trojans Hidden in RTL Don’t Cares – Automated Insertion and Prevention Methodologies, in International Test Conference (ITC), 2015. ITC15.pdf (278.4 KB)
M. Angel Lastras-Montano, Ghofrani, A., and Cheng, K. - T. Tim, HReRAM: A Hybrid Reconfigurable Resistive Random-Access Memory, Proceedings Design, Automation, and Test in Europe (DATE), IEEE, 2015. DATE15_1.pdf (5.59 MB)
A. Ghofrani, Lastras-Montano, M. Angel, Gaba, S., Payand, M., Lu, W., Theogarajan, L., and Cheng, K. - T. Tim, A low-Power Variation-Aware Adaptive Write Scheme for Access-Transistor-Free Memristive Memory, ACM Journal on Emerging Technologies in Computing Systems (JETC), vol. 12, no. 1, 2015. JETC15.pdf (3.27 MB)
F. Lin, Hsu, C. - K., Busetto, A. Giovanni, and Cheng, K. - T., Pairwise Proximity-Based Features for Test Escape Screening, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015. iccad15.pdf (792.61 KB)
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Toward Large-Scale Access-Transistor-Free Memristive Crossbars, in Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific, 2015. ASPDAC_invited.pdf (3.38 MB)
R. Wu, Chen, C. - H., Li, C., Huang, T. - C., Lan, F., Zhang, C., Pan, Y., Bowers, J. E., Beausoleil, R. G., and Cheng, K. - T., Variation-Aware Adaptive Tuning for Nanophotonic Interconnects, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015. ICCAD2015_IEEE.pdf (967.71 KB)
J. Rofeh, Sodhi, A., Payvand, M., Lastras-Montano, M. Angel, Ghofrani, A., Madhavan, A., Yemenicioglu, S., Cheng, K. - T. Tim, and Theogarajan, L., Vertical Integration of Memristors onto Foundry CMOS Dies using Wafer-Scale Integration, in IEEE Electronic Components and Technology Conference (ECTC’15), San Diego, USA, 2015. ECTC15.pdf (378.91 KB)
2014
S. Feng, Shang, K., Bovington, J., Wu, R., Cheng, K. - T. Tim, Bowers, J. E., and Ben Yoo, S. J., Athermal characteristics of TiO2-clad silicon waveguides at 1.3 um, in Photonics Conference (IPC), IEEE, San Diego, CA, 2014. IPC2014_submit.pdf (213.72 KB)
D. Xiang, Sui, W., Yin, B., and Cheng, K. - T. Tim, Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1968-1979, 2014.
A. Rahimi, Ghofrani, A., Lastras-Montano, M. Angel, Cheng, K. - T. Tim, Benini, L., and Gupta, R. K., Energy-efficient GPGPU architectures via collaborative compilation and memristive memory-based computing, in Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE, 2014. DAC14-memristor.pdf (1.69 MB)
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Feature engineering with canonical analysis for effective statistical tests screening test escapes, in Test Conference (ITC), 2014 IEEE International, 2014. itc14.pdf (4.28 MB)
S. Zhang, Lin, F., Hsu, C. - K., Cheng, K. - T. Tim, and Wang, H., Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Learning from Production Test Data: Correlation Exploration and Feature Engineering, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014. ats14.pdf (2.45 MB)
D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., Test-Quality Optimization for Variable n -Detections of Transition Faults, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.
J. Bovington, Wu, R., Cheng, K. - T. Tim, and Bowers, J. E., Thermal stress implications in athermal TiO2 waveguides on a silicon substrate, Optics Express, vol. 22, no. 1, pp. 661–666, 2014. OE14.pdf (1.08 MB)

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