Biblio

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C. H. - P. Wen, Wang, L. C., and Cheng, K. - T. Tim, Simulation-based functional test generation for embedded processors, Computers, IEEE Transactions on, vol. 55, pp. 1335–1343, 2006.
C. H. - P. Wen, Wang, L. - C., Cheng, K. - T. Tim, Yang, K., Liu, W. - T., Chen, J. - J., and , On a software-based self-test methodology and its application, in VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, 2005, pp. 107–113.
Y. Wang, M. Seyedi, A., Wu, R., Hulme, J., Fiorentino, M., Beausoleil, R. G., and Cheng, K. - T. Tim, Energy-Efficient Channel Alignment of DWDM Silicon Photonic Transceivers, in Design, Automation and Test in Europe (DATE), Dresden, Germany, 2018.PDF icon DATE18_YW_camera_ready_v4.pdf (1.45 MB)
Y. Wang, M. Seyedi, A., Hulme, J., Fiorentino, M., Beausoleil, R. G., and Cheng, K. - T. Tim, Bidirectional Tuning of Microring-Based Silicon Photonic Transceivers for Optimal Energy Efficiency, in 24th Asia and South Pacific Design Automation Conference (ASP-DAC), Tokyo, Japan, 2019.PDF icon ASP-DAC19-Yuyang-camera_ready.pdf (2.94 MB)
Y. Wang, Shao, L., Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Taming Emerging Devices’ Variation and Reliability Challenges with Architectural and System Solutions, in 32nd IEEE International Conference on Microelectronic Test Structures (Invited Paper), Kita-Kyushu City, Japan, 2019.PDF icon Invited-3-Cheng.pdf (522.21 KB)
L. - T. Wang, Chang, Y. - W., and Cheng, K. - T. Tim, Electronic design automation: synthesis, verification, and test. Morgan Kaufmann, 2009.
Y. Wang and Cheng, K. - T. Tim, Task Mapping-Assisted Laser Power Scaling for Optical Network-on-Chips, in International Conference On Computer Aided Design (ICCAD), Westminster, CO, 2019.PDF icon 03C_3_Wang_finalpaper_08_06_2019_17_29.pdf (2.15 MB)
P. - Y. Wang, Chang, H. - M. Sherman, and Cheng, K. - T. Tim, An all-digital built-in self-test technique for transfer function characterization of RF PLLs, in Design, Automation Test in Europe Conference Exhibition (DATE), 2011, 2011.
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L. Shao, Huang, T. - C. Jim, Lei, T., Bao, Z., Beausoleil, R. G., and Cheng, K. - T. Tim, Compact Modeling of Carbon Nanotube Thin Film Transistors for Flexible Circuit Design, in Design, Automation and Test in Europe (DATE), Best Paper Award Nominations , Dresden, Germany, 2018.PDF icon DATE_CNTTFT2018.pdf (2.1 MB)
L. Shao, Huang, T. - C. Jim, Lei, T., Bao, Z., Beausoleil, R. G., and Cheng, K. - T. Tim, Process Design Kit for Flexible Hybrid Electronics, in in 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), (Invited Paper), 2018.PDF icon aspdac_pdk_for_FHE2018.pdf (1.38 MB)
L. Shao, Chu, T. - Y., Tao, Y., and Cheng, K. - T. Tim, Fully Printed Organic Pseudo-CMOS Circuits for Sensing Applications, in 1st IEEE International Flexible Electronics Technology Conference (IFETC), Ottawa, Canada, 2018.PDF icon 2018IEEE-IFETC-Final.pdf (1.08 MB)
L. Shao, Lei, T., Huang, T. - C. Jim, Li, S., Chu, T. - Y., Wong, M., Beausoleil, R. G., Bao, Z., and Cheng, K. - T. Tim, Compact Modeling of Thin Film Transistors for Flexible Hybrid IoT Design, IEEE Design & Test, no. Special Issue: Circuits and Systems for VLSI Internet-of-Things (IoT) Devices, 2019.PDF icon IEEED&T.pdf (2.79 MB)
L. Shao, Li, S., Lei, T., Huang, T. - C. Jim, Beausoleil, R. G., Bao, Z., and Cheng, K. - T. Tim, Ultra-thin Skin Electronics for High Quality and Continuous Skin-Sensor-Silicon Interfacing, in 56th Design Automation Conference, 2019.PDF icon DAC_ACM.pdf (3.68 MB)
S. Shamshiri and Cheng, K. - T. Tim, Yield and cost analysis of a reliable NoC, in VLSI Test Symposium, 2009. VTS'09. 27th IEEE, 2009.
S. Shamshiri and Cheng, K. - T. Tim, Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy, in VLSI Test Symposium (VTS), 2010 28th, 2010.
S. Shamshiri and Cheng, K. - T. Tim, Error-locality-aware linear coding to correct multi-bit upsets in SRAMs, in Test Conference (ITC), 2010 IEEE International, 2010.
S. Shamshiri, Lisherness, P., Pan, S. - J., and Cheng, K. - T. Tim, A cost analysis framework for multi-core systems with spares, in Test Conference, 2008. ITC 2008. IEEE International, 2008.
S. Shamshiri, Ghofrani, A., and Cheng, K. - T. Tim, End-to-end error correction and online diagnosis for on-chip networks, in Test Conference (ITC), 2011 IEEE International, 2011.PDF icon ITC11.pdf (502.59 KB)
S. Shamshiri and Cheng, K. - T. Tim, Modeling yield, cost, and quality of a spare-enhanced multicore chip, Computers, IEEE Transactions on, vol. 60, pp. 1246–1259, 2011.
A. M. Seyedi, Wu, R., Chen, C. - H., Fiorentino, M., and Beausoleil, R. G., 15 Gb/s Transmission with Wide-FSR Carrier Injection Ring Modulator for Tb/s Optical Links, in Conference on Lasers and Electro-Optics (CLEO), San Jose, CA, 2016.PDF icon Seyedi et al. - Unknown - 15 Gb s Transmission with Wide-FSR Carrier Injection Ring Modulator for Tb s Optical Links.pdf (2.32 MB)
I. San, Fern, N., Koc, C. Kaya, and Cheng, K. - T. Tim, Trojans Modifying Soft-Processor Instruction Sequences Embedded in FPGA Bitstreams, in Proceedings of the 26th International Conference on Field-Programmable Logic and Applications (FPL), 2016.PDF icon FPL16.pdf (170.74 KB)

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