Biblio

Export 166 results:
Author [ Year(Desc)]
2006
Q. Zhu, Yeh, M. - C., and Cheng, K. - T. Tim, Multimodal fusion using learned text concepts for image categorization, in Proceedings of the 14th annual ACM international conference on Multimedia, 2006.
Y. - C. Lin and Cheng, K. - T. Tim, Multiple-fault diagnosis based on single-fault activation and single-output observation, in Design, Automation and Test in Europe, 2006. DATE'06. Proceedings, 2006, vol. 1, pp. 1–6.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, Pseudofunctional testing, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 1535–1546, 2006.
C. H. - P. Wen, Wang, L. C., and Cheng, K. - T. Tim, Simulation-based functional test generation for embedded processors, Computers, IEEE Transactions on, vol. 55, pp. 1335–1343, 2006.
K. Roy, Mak, T. M., and Cheng, K. - T. Tim, Test consideration for nanometer-scale CMOS circuits, Design & Test of Computers, IEEE, vol. 23, pp. 128–136, 2006.
M. Lin and Cheng, K. - T. Tim, Testable design for adaptive linear equalizer in high-speed serial links, in Test Conference, 2006. ITC'06. IEEE International, 2006.
K. Yang and Cheng, K. - T. Tim, Timing-reasoning-based delay fault diagnosis, in Proceedings of the conference on Design, automation and test in Europe: Proceedings, 2006, pp. 418–423.
Y. - C. Lin and Cheng, K. - T. Tim, A unified approach to test generation and test data volume reduction, in Test Conference, 2006. ITC'06. IEEE International, 2006.
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S., and Wei, W. - L., Unknown-tolerance analysis and test-quality control for test response compaction using space compactors, in Proceedings of the 43rd annual Design Automation Conference, 2006.
2007
D. Hong and Cheng, K. - T. Tim, An accurate jitter estimation technique for efficient high speed I/O testing, in Asian Test Symposium, 2007. ATS'07. 16th, 2007.
T. - C. Jim Huang and Cheng, K. - T. Tim, Design for Printability for Flexible Electronics: Self-Tunable Cell-Library Design, in International Symposium for Flexible Electronics and Displays (ISFED), Hsinchu, Taiwan, 2007.
F. Zheng, Cheng, K. - T. Tim, Yan, X., Moondanos, J., and Hanna, Z., An efficient diagnostic test pattern generation framework using boolean satisfiability, in Asian Test Symposium, 2007. ATS'07. 16th, 2007.
S. - J. Pan and Cheng, K. - T. Tim, A framework for system reliability analysis considering both system error tolerance and component test quality, in Proceedings of the conference on Design, automation and test in Europe, 2007.
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S. T., and Wei, W. - L., A hybrid scheme for compacting test responses with unknown values, in Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, 2007.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, Multiple-fault diagnosis based on adaptive diagnostic test pattern generation, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 26, pp. 932–942, 2007.
K. Yang and Cheng, K. - T. Tim, Silicon Debug for Timing Errors, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 26, pp. 2084–2088, 2007.
M. Lin and Cheng, K. - T. Tim, Testable design for advanced serial-link transceivers, in Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE'07, 2007.
2008
D. Hong and Cheng, K. - T. Tim, Accurate Bit-Error-Rate estimation for efficient high speed I/O testing, in Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on, 2008.
D. Hong and Cheng, K. - T. Tim, Bit-error rate estimation for bang-bang clock and data recovery circuit in high-speed serial links, in VLSI Test Symposium, 2008. VTS 2008. 26th IEEE, 2008.
C. - K. Ong, Hong, D., Cheng, K. - T. Tim, and Wang, L. - C., A clock-less jitter spectral analysis technique, Circuits and Systems I: Regular Papers, IEEE Transactions on, vol. 55, pp. 2263–2272, 2008.
S. Shamshiri, Lisherness, P., Pan, S. - J., and Cheng, K. - T. Tim, A cost analysis framework for multi-core systems with spares, in Test Conference, 2008. ITC 2008. IEEE International, 2008.
H. - M. Sherman Chang, Lin, M. - S., and Cheng, K. - T. Tim, Digitally-assisted analog/RF testing for mixed-signal SoCs, in Asian Test Symposium, 2008. ATS'08. 17th, 2008.
T. - C. Jim Huang, Cheng, K. - T. Tim, Tseng, H. - Y., and Kung, C. - P., Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver, ACM Journal on Emerging Technologies in Computing Systems (JETC), vol. 4, no. 3, 2008.
S. Mirzaeian, Zheng, F., and Cheng, K. - T. Tim, RTL error diagnosis using a word-level SAT-solver, in Test Conference, 2008. ITC 2008. IEEE International, 2008.
M. Gao, Chang, H. - M. Sherman, Lisherness, P., and Cheng, K. - T. Tim, Time-Multiplexed Online Checking: A Feasibility Study, in Asian Test Symposium, 2008. ATS'08. 17th, 2008.

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