Biblio

Export 167 results:
Author [ Year(Asc)]
2014
S. Feng, Shang, K., Bovington, J., Wu, R., Cheng, K. - T. Tim, Bowers, J. E., and Ben Yoo, S. J., Athermal characteristics of TiO2-clad silicon waveguides at 1.3 um, in Photonics Conference (IPC), IEEE, San Diego, CA, 2014.PDF icon IPC2014_submit.pdf (213.72 KB)
D. Xiang, Sui, W., Yin, B., and Cheng, K. - T. Tim, Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1968-1979, 2014.
A. Rahimi, Ghofrani, A., Lastras-Montano, M. Angel, Cheng, K. - T. Tim, Benini, L., and Gupta, R. K., Energy-efficient GPGPU architectures via collaborative compilation and memristive memory-based computing, in Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE, 2014.PDF icon DAC14-memristor.pdf (1.69 MB)
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Feature engineering with canonical analysis for effective statistical tests screening test escapes, in Test Conference (ITC), 2014 IEEE International, 2014.PDF icon itc14.pdf (4.28 MB)
S. Zhang, Lin, F., Hsu, C. - K., Cheng, K. - T. Tim, and Wang, H., Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Learning from Production Test Data: Correlation Exploration and Feature Engineering, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014.PDF icon ats14.pdf (2.45 MB)
D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., Test-Quality Optimization for Variable n -Detections of Transition Faults, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.
J. Bovington, Wu, R., Cheng, K. - T. Tim, and Bowers, J. E., Thermal stress implications in athermal TiO2 waveguides on a silicon substrate, Optics Express, vol. 22, no. 1, pp. 661–666, 2014.PDF icon OE14.pdf (1.08 MB)
2013
M. Angel Lastras-Montano, Ghofrani, A., and Cheng, K. - T. Tim, Architecting Low Power Crossbar-Based Memristive RAM, in Non-Volatile Memory Workshop, San Diego, USA, 2013.PDF icon NVMW13.pdf (721.83 KB)
L. Gao, Merrikh-Bayat, F., Alibart, F., Guo, X., Hoskins, B. D., Cheng, K. - T. Tim, and Strukov, D. B., Digital-to-analog and analog-to-digital conversion with metal oxide memristors for ultra-low power computing, in Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on, 2013.
H. - M. Chang Chang, Huang, J. - L., Kwai, D. - M., Cheng, K. - T. Tim, and Wu, C. - W., Low-cost error tolerance scheme for 3-D CMOS imagers, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 21, pp. 465–474, 2013.
P. Lisherness, Lesperance, N., and Cheng, K. - T. Tim, Mutation analysis with coverage discounting, in Design, Automation Test in Europe Conference (DATE), 2013.PDF icon DATE13.pdf (167.64 KB)
J. Bovington, Wu, R., Cheng, K. - T. Tim, and Bowers, J. E., Role of thermal stress in athermal waveguide design using TiO2 waveguides on a silicon substrate, in Photonics Conference (IPC), IEEE, Seattle, WA, 2013.PDF icon IPC_2013_final.pdf (215.82 KB)
C. - K. Hsu, Lin, F., Cheng, K. - T. Tim, Zhang, W., Li, X., Carulli, J. M., and Butler, K. M., Test data analytics - Exploring spatial and test-item correlations in production test data, in Test Conference (ITC), 2013 IEEE International, 2013.
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Towards data reliable crossbar-based memristive memories, in Test Conference (ITC), 2013 IEEE International, 2013.PDF icon ITC'13_CR.pdf (2.68 MB)
2012
K. - T. Tim Cheng and Strukov, D. B., 3D CMOS-memristor hybrid circuits: devices, integration, architecture, and applications, in Proceedings of the 2012 ACM International Symposium on Physical Design, 2012.
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Adaptive test selection for post-silicon timing validation: A data mining approach, in Test Conference (ITC), 2012 IEEE International, 2012.
A. Ghofrani, Parikh, R., Shamshiri, S., DeOrio, A., Cheng, K. - T. Tim, and Bertacco, V., Comprehensive online defect diagnosis in on-chip networks., in VLSI Test Symposium (VTS), 2012.PDF icon VTS12_cr.pdf (710.92 KB)
M. Gao, Lisherness, P., Cheng, K. - T. Tim, and Liou, J. - J., On error modeling of electrical bugs for post-silicon timing validation, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
P. Lisherness and Cheng, K. - T. Tim, Improving validation coverage metrics to account for limited observability, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
Y. Zheng, Lisherness, P., Shamshiri, S., Ghofrani, A., Yang, S., and Cheng, K. - T. Tim, Post-fabrication reconfiguration for power-optimized tuning of optically connected multi-core systems, in Design Automation Conference (ASP-DAC), Asia and South Pacific, 2012.PDF icon ASPDAC2012_optical.pdf (221.18 KB)
Y. Zheng, Lisherness, P., Gao, M., Bovington, J., Yang, S., and Cheng, K. - T. Tim, Power-efficient calibration and reconfiguration for on-chip optical communication, in Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012.PDF icon DATE2012_optical.pdf (341.67 KB)

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