Biblio
] , “Energy-efficient GPGPU architectures via collaborative compilation and memristive memory-based computing”, in Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE, 2014.
DAC14-memristor.pdf (1.69 MB)
DAC14-memristor.pdf (1.69 MB), “Approximate Associative Memristive Memory for Energy-Efficient GPUs”, Design, Automation Test in Europe Conference Exhibition (DATE), 2015. DATE15-A2M2-CR.pdf (543.85 KB)
DATE15-A2M2-CR.pdf (543.85 KB), “A Configurable CMOS Memory Platform for 3D Integrated Memristors”, in International Symposium on Circuits and Systems , Lisbon, Portugal, 2015. ISCAS15.pdf (714.06 KB)
ISCAS15.pdf (714.06 KB), “RTL SAT simplification by boolean and interval arithmetic reasoning”, in Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design, 2005, pp. 297–302.
, “Structural search for RTL with predicate learning”, in Proceedings of the 42nd annual Design Automation Conference, 2005, pp. 451–456.
, “Generation of shorter sequences for high resolution error diagnosis using sequential sat”, in Proceedings of the 2006 Asia and South Pacific Design Automation Conference, 2006, pp. 25–29.
, “A framework for system reliability analysis considering both system error tolerance and component test quality”, in Proceedings of the conference on Design, automation and test in Europe, 2007.
, “A clock-less jitter spectral analysis technique”, Circuits and Systems I: Regular Papers, IEEE Transactions on, vol. 55, pp. 2263–2272, 2008.
, “RTL error diagnosis using a word-level SAT-solver”, in Test Conference, 2008. ITC 2008. IEEE International, 2008.
, “SEChecker: A Sequential Equivalence Checking Framework Based on th Invariants”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 17, pp. 733–746, 2009.
, “Sequential equivalence checking based on K-th invariants and circuit SAT solving”, in High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International, 2005, pp. 45–51.
, “IChecker: An efficient checker for inductive invariants”, in High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International, 2006.
, “An efficient sequential SAT solver with improved search strategies”, in Proceedings of the conference on Design, Automation and Test in Europe-Volume 2, 2005, pp. 1102–1107.
, “A Portable Multi-pitch e-Drum Based on Printed Flexible Pressure Sensors”, in Proceedings of the Conference on Design, Automation and Test in Europe, 3001 Leuven, Belgium, Belgium, 2010.
, “Mutation analysis with coverage discounting”, in Design, Automation Test in Europe Conference (DATE), 2013. DATE13.pdf (167.64 KB)
DATE13.pdf (167.64 KB), “SCEMIT: A SystemC error and mutation injection tool”, in Design Automation Conference (DAC), 2010 47th ACM/IEEE, 2010.
, “Coverage discounting: A generalized approach for testbench qualification”, in High Level Design Validation and Test Workshop (HLDVT), 2011 IEEE International, 2011.
, “Improving validation coverage metrics to account for limited observability”, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
, “An instrumented observability coverage method for system validation”, in High Level Design Validation and Test Workshop, 2009. HLDVT 2009. IEEE International, 2009.
, “Accurate diagnosis of multiple faults”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 153–156.
, “Production-oriented interface testing for PCI-Express by enhanced loop-back technique”, in Test Conference, 2005. Proceedings. ITC 2005. IEEE International, 2005, p. 10–pp.
, “Feature engineering with canonical analysis for effective statistical tests screening test escapes”, in Test Conference (ITC), 2014 IEEE International, 2014. itc14.pdf (4.28 MB)
itc14.pdf (4.28 MB), “An Artificial Neural Network Approach for Screening Test Escapes”, Asia and South Pacific Design Automation Conference (ASP-DAC). Chiba/Tokyo, Japan, 2017. aspdac17.pdf (810.67 KB)
aspdac17.pdf (810.67 KB), “Multiple-fault diagnosis based on single-fault activation and single-output observation”, in Design, Automation and Test in Europe, 2006. DATE'06. Proceedings, 2006, vol. 1, pp. 1–6.
, “Learning from Production Test Data: Correlation Exploration and Feature Engineering”, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014. ats14.pdf (2.45 MB)
ats14.pdf (2.45 MB)