Biblio

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F
K. Fukuda, Huang, T. - C. Jim, Kuribara, K., Yokota, T., Sekitani, T., Zschieschang, U., Klauk, H., Ikeda, M., Kuwabara, H., Yamamoto, T., Takimiya, K., Cheng, K. - T. Tim, and Someya, T., Organic Pseudo-CMOS for 2V Operational High-Speed Circuits. 2011.
K. Fukuda, Sekitani, T., Yokota, T., Kuribara, K., Huang, T. - C. Jim, Sakurai, T., Zschieschang, U., Klauk, H., Ikeda, M., Kuwabara, H., Yamamoto, T., Takimiya, K., Cheng, K. - T. Tim, and Someya, T., Organic pseudo-CMOS circuits for low-voltage large-gain high-speed operation, Electron Device Letters, IEEE, vol. 32, pp. 1448–1450, 2011.
N. Fern, Kulkarni, S., and Cheng, K. - T. Tim, Hardware Trojans Hidden in RTL Don’t Cares – Automated Insertion and Prevention Methodologies, in International Test Conference (ITC), 2015.PDF icon ITC15.pdf (278.4 KB)
N. Fern and Cheng, K. - T. Tim, Detecting Hardware Trojans in Unspecified Functionality Using Mutation Testing, in International Conference on Computer Aided Design (ICCAD), 2015.PDF icon ICCAD15.pdf (382.74 KB)
N. Fern, San, I., Koc, C. Kaya, and Cheng, K. - T. Tim, Hardware Trojans in Incompletely Specified On-chip Bus Systems, in Design, Automation, Test in Europe (DATE), 2016.PDF icon DATE16_4page_aff.pdf (315.73 KB)
N. Fern, San, I., Koc, C. Kaya, and Cheng, K. - T. Tim, Hiding Hardware Trojan Communication Channels in Partially Specified SoC Bus Functionality, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. PP, 2016.PDF icon TCAD.pdf (2.23 MB)
N. Fern, San, I., and Cheng, K. - T. Tim, Detecting Hardware Trojans in Unspecified Functionality Through Solving Satisfiability Problems, in Asia and South Pacific Design Automation Conference (ASP-DAC), 2017.PDF icon ASPDAC17_v2.pdf (399.81 KB)
N. Fern and Cheng, K. - T. Tim, Verification and Trust for Unspecified IP Functionality, in Hardware IP Security and Trust, P. Mishra, Bhunia, S., and Tehranipoor, M., Eds. Springer, 2017.
N. Fern and Cheng, K. - T. Tim, Mining Mutation Testing Simulation Traces for Security and Testbench Debugging, in International Conference on Computer-Aided Design (ICCAD), 2017.PDF icon ICCAD17_v2.pdf (650.84 KB)
S. Feng, Shang, K., Bovington, J., Wu, R., Cheng, K. - T. Tim, Bowers, J. E., and Ben Yoo, S. J., Athermal characteristics of TiO2-clad silicon waveguides at 1.3 um, in Photonics Conference (IPC), IEEE, San Diego, CA, 2014.PDF icon IPC2014_submit.pdf (213.72 KB)
T. Feng, Wang, L. - C., Cheng, K. - T. Tim, and Lin, C. - C. Andy, Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator, ACM Transactions on Design Automation of Electronic Systems (TODAES), vol. 10, pp. 627–650, 2005.
S. Feng, Shang, K., Bovington, J., Wu, R., Guan, B., Cheng, K. - T. Tim, Bowers, J. E., and Ben Yoo, S. J., Athermal silicon ring resonators clad with titanium dioxide for 1.3µm wavelength operation, Optics Express, 2015.PDF icon OE_athermal1.3.pdf (1.11 MB)
C
K. - T. Tim Cheng and Huang, T. - C. Jim, Design, analysis, and test of low-power and reliable flexible electronics, in VLSI Test Symposium (VTS), 2010 28th, 2010.
K. - T. Tim Cheng and Chang, H. - M. Sherman, Test strategies for adaptive equalizers, in Custom Integrated Circuits Conference, 2009. CICC'09. IEEE, 2009.
K. - T. Tim Cheng and Strukov, D. B., 3D CMOS-memristor hybrid circuits: devices, integration, architecture, and applications, in Proceedings of the 2012 ACM International Symposium on Physical Design, 2012.
K. - T. Tim Cheng and Chang, H. - M. Sherman, Recent Advances in Analog, Mixed-Signal, and RF Testing, Information and Media Technologies, vol. 5, pp. 338-365, 2010.
K. - T. Tim Cheng, Embedded Software-Based Self-Testing for SoC Design, in Embedded Systems Handbook, CRC Press, 2005, pp. 28-1-28-19.
K. - T. Tim Cheng, Automatic Test Pattern Generation, in EDA for IC System Design, Verification, and Testing, CRC Press, 2006.
M. C. - T. Chao, Wang, S., Chakradhar, S. T., Wei, W., and Cheng, K. - T. Tim, Coverage loss by using space compactors in presence of unknown values, in Proceedings of the conference on Design, automation and test in Europe: Proceedings, 2006, pp. 1053–1054.
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S., and Wei, W. - L., Unknown-tolerance analysis and test-quality control for test response compaction using space compactors, in Proceedings of the 43rd annual Design Automation Conference, 2006.
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S. T., and Wei, W. - L., A hybrid scheme for compacting test responses with unknown values, in Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, 2007.
M. C. - T. Chao, Wang, S., Chakradhar, S. T., and Cheng, K. - T. Tim, ChiYun compact: a novel test compaction technique for responses with unknown values, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.
M. C. - T. Chao, Wang, S., Chakradhar, S. T., and Cheng, K. - T. Tim, Response shaper: a novel technique to enhance unknown tolerance for output response compaction, in Computer-Aided Design, 2005. ICCAD-2005. IEEE/ACM International Conference on, 2005, pp. 80–87.

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