Biblio

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Author [ Year(Desc)]
Filters: Author is Wei, Wen-Long  [Clear All Filters]
2006
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S., and Wei, W. - L., “Unknown-tolerance analysis and test-quality control for test response compaction using space compactors”, in Proceedings of the 43rd annual Design Automation Conference, 2006.
2007
M. C. - T. Chao, Cheng, K. - T. Tim, Wang, S., Chakradhar, S. T., and Wei, W. - L., “A hybrid scheme for compacting test responses with unknown values”, in Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design, 2007.