Biblio

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Y. - C. Lin, Lu, F., Yang, K., and Cheng, K. - T. Tim, “Constraint extraction for pseudo-functional scan-based delay testing”, in Proceedings of the 2005 Asia and South Pacific Design Automation Conference, 2005, pp. 166–171.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Pseudo-functional scan-based bist for delay fault”, in VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, 2005, pp. 229–234.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Accurate diagnosis of multiple faults”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 153–156.
Y. - C. Lin and Cheng, K. - T. Tim, “Multiple-fault diagnosis based on single-fault activation and single-output observation”, in Design, Automation and Test in Europe, 2006. DATE'06. Proceedings, 2006, vol. 1, pp. 1–6.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Pseudofunctional testing”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 1535–1546, 2006.
Y. - C. Lin and Cheng, K. - T. Tim, “A unified approach to test generation and test data volume reduction”, in Test Conference, 2006. ITC'06. IEEE International, 2006.
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Multiple-fault diagnosis based on adaptive diagnostic test pattern generation”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 26, pp. 932–942, 2007.