Biblio
] , “Coverage loss by using space compactors in presence of unknown values”, in Proceedings of the conference on Design, automation and test in Europe: Proceedings, 2006, pp. 1053–1054.
, “Coverage loss by using space compactors in presence of unknown values”, in Proceedings of the conference on Design, automation and test in Europe: Proceedings, 2006, pp. 1053–1054.
, “Efficient identification of multi-cycle false path”, in Proceedings of the 2006 Asia and South Pacific Design Automation Conference, 2006, pp. 360–365.
, “Generation of shorter sequences for high resolution error diagnosis using sequential sat”, in Proceedings of the 2006 Asia and South Pacific Design Automation Conference, 2006, pp. 25–29.
, “IChecker: An efficient checker for inductive invariants”, in High-Level Design Validation and Test Workshop, 2006. Eleventh Annual IEEE International, 2006.
, “Multimodal fusion using learned text concepts for image categorization”, in Proceedings of the 14th annual ACM international conference on Multimedia, 2006.
, “Multiple-fault diagnosis based on single-fault activation and single-output observation”, in Design, Automation and Test in Europe, 2006. DATE'06. Proceedings, 2006, vol. 1, pp. 1–6.
, “Pseudofunctional testing”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 25, pp. 1535–1546, 2006.
, “Simulation-based functional test generation for embedded processors”, Computers, IEEE Transactions on, vol. 55, pp. 1335–1343, 2006.
, “Test consideration for nanometer-scale CMOS circuits”, Design & Test of Computers, IEEE, vol. 23, pp. 128–136, 2006.
, “Testable design for adaptive linear equalizer in high-speed serial links”, in Test Conference, 2006. ITC'06. IEEE International, 2006.
, “Timing-reasoning-based delay fault diagnosis”, in Proceedings of the conference on Design, automation and test in Europe: Proceedings, 2006, pp. 418–423.
, “A unified approach to test generation and test data volume reduction”, in Test Conference, 2006. ITC'06. IEEE International, 2006.
, “Unknown-tolerance analysis and test-quality control for test response compaction using space compactors”, in Proceedings of the 43rd annual Design Automation Conference, 2006.
, “Unknown-tolerance analysis and test-quality control for test response compaction using space compactors”, in Proceedings of the 43rd annual Design Automation Conference, 2006.
, “Unknown-tolerance analysis and test-quality control for test response compaction using space compactors”, in Proceedings of the 43rd annual Design Automation Conference, 2006.
, “Accurate diagnosis of multiple faults”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 153–156.
, “ChiYun compact: a novel test compaction technique for responses with unknown values”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.
, “ChiYun compact: a novel test compaction technique for responses with unknown values”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.
, “ChiYun compact: a novel test compaction technique for responses with unknown values”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.
, “Constraint extraction for pseudo-functional scan-based delay testing”, in Proceedings of the 2005 Asia and South Pacific Design Automation Conference, 2005, pp. 166–171.
, “Efficient conflict-based learning in an RTL circuit constraint solver”, in Design, Automation and Test in Europe, 2005. Proceedings, 2005, pp. 666–671.
, “An efficient sequential SAT solver with improved search strategies”, in Proceedings of the conference on Design, Automation and Test in Europe-Volume 2, 2005, pp. 1102–1107.
, “An efficient sequential SAT solver with improved search strategies”, in Proceedings of the conference on Design, Automation and Test in Europe-Volume 2, 2005, pp. 1102–1107.
, “Embedded Software-Based Self-Testing for SoC Design”, in Embedded Systems Handbook, CRC Press, 2005, pp. 28-1-28-19.