Biblio

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A. Ghofrani, Parikh, R., Shamshiri, S., DeOrio, A., Cheng, K. - T. Tim, and Bertacco, V., Comprehensive online defect diagnosis in on-chip networks., in VLSI Test Symposium (VTS), 2012.PDF icon VTS12_cr.pdf (710.92 KB)
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Towards data reliable crossbar-based memristive memories, in Test Conference (ITC), 2013 IEEE International, 2013.PDF icon ITC'13_CR.pdf (2.68 MB)
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Toward Large-Scale Access-Transistor-Free Memristive Crossbars, in Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific, 2015.PDF icon ASPDAC_invited.pdf (3.38 MB)
A. Ghofrani, Lastras-Montano, M. Angel, Gaba, S., Payand, M., Lu, W., Theogarajan, L., and Cheng, K. - T. Tim, A low-Power Variation-Aware Adaptive Write Scheme for Access-Transistor-Free Memristive Memory, ACM Journal on Emerging Technologies in Computing Systems (JETC), vol. 12, no. 1, 2015.PDF icon JETC15.pdf (3.27 MB)
A. Ghofrani, Rahimi, A., Lastras-Montano, M. Angel, Benini, L., Gupta, R. K., and Cheng, K. - T. Tim, Associative Memristive Memory for Approximate Computing in GPUs, IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS), vol. PP, no. 99, 2016.PDF icon JETCAS_16.pdf (6.36 MB)
A. Ghofrani, Lastras-Montano, M. Angel, Wang, Y., and Cheng, K. - T. Tim, In-place Repair for Resistive Memories Utilizing Complementary Resistive Switches, International Symposium on Low Power Electronics and Design (ISLPED). ACM, San Diego, CA, USA, 2016.PDF icon ISLPED_16.pdf (4.14 MB)
M. Gao, Chang, H. - M. Sherman, Lisherness, P., and Cheng, K. - T. Tim, Time-multiplexed online checking, Computers, IEEE Transactions on, vol. 60, pp. 1300–1312, 2011.
M. Gao, Lisherness, P., Cheng, K. - T. Tim, and Liou, J. - J., On error modeling of electrical bugs for post-silicon timing validation, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Adaptive test selection for post-silicon timing validation: A data mining approach, in Test Conference (ITC), 2012 IEEE International, 2012.
M. Gao and Cheng, K. - T. Tim, Low Overhead Time-Multiplexed Online Checking: A Case Study of An H.264 Decoder, in Asian Test Symposium, 2009. ATS '09., 2009.
M. Gao and Cheng, K. - T. Tim, A case study of Time-Multiplexed Assertion Checking for post-silicon debugging, in High Level Design Validation and Test Workshop (HLDVT), 2010 IEEE International, 2010.
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, Post-silicon Bug Detection for Variation Induced Electrical Bugs, in Proceedings of the 16th Asia and South Pacific Design Automation Conference, Piscataway, NJ, USA, 2011.
L. Gao, Merrikh-Bayat, F., Alibart, F., Guo, X., Hoskins, B. D., Cheng, K. - T. Tim, and Strukov, D. B., Digital-to-analog and analog-to-digital conversion with metal oxide memristors for ultra-low power computing, in Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on, 2013.
M. Gao, Chang, H. - M. Sherman, Lisherness, P., and Cheng, K. - T. Tim, Time-Multiplexed Online Checking: A Feasibility Study, in Asian Test Symposium, 2008. ATS'08. 17th, 2008.