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Yield and cost analysis of a reliable NoC
Submitted by
Amirali Ghofrani
on Tue, 04/07/2015 - 22:33
S. Shamshiri
and
Cheng, K. - T. Tim
,
“
Yield and cost analysis of a reliable NoC
”
, in
VLSI Test Symposium, 2009. VTS'09. 27th IEEE
, 2009.
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