Accurate Bit-Error-Rate estimation for efficient high speed I/O testing

Submitted by Amirali Ghofrani on Tue, 04/07/2015 - 22:35
D. Hong and Cheng, K. - T. Tim, “Accurate Bit-Error-Rate estimation for efficient high speed I/O testing”, in Circuits and Systems, 2008. APCCAS 2008. IEEE Asia Pacific Conference on, 2008.