Pairwise Proximity-Based Features for Test Escape Screening

Submitted by Fan Lin on Sun, 07/12/2015 - 20:20
F. Lin, Hsu, C. - K., Busetto, A. Giovanni, and Cheng, K. - T., “Pairwise Proximity-Based Features for Test Escape Screening”, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015.
PDF: 
iccad15.pdf