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Pairwise Proximity-Based Features for Test Escape Screening
Submitted by
Fan Lin
on Sun, 07/12/2015 - 20:20
F. Lin
,
Hsu, C. - K.
,
Busetto, A. Giovanni
, and
Cheng, K. - T. Tim
,
“
Pairwise Proximity-Based Features for Test Escape Screening
”
, in
International Conference on Computer-Aided Design (ICCAD)
, Austin, TX, 2015.
PDF:
iccad15.pdf
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