Spatial Pattern Analysis of Process Variations in Silicon Microring Modulators

Submitted by Rui Wu on Fri, 03/25/2016 - 10:58

R. Wu, Chen, C. - H., Huang, T. - C. Jim, Beausoleil, R. G., and Cheng, K. - T. Tim, “Spatial Pattern Analysis of Process Variations in Silicon Microring Modulators”, in IEEE Optical Interconnect Conference, San Diego, CA, 2016.

PDF:

OIC2016_final.pdf