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Variation and Failure Characterization Through Pattern Classification of Test Data From Multiple Test Stages
Submitted by
Chun-Kai Hsu
on Fri, 08/12/2016 - 22:10
C. - K. Hsu
,
Sarson, P.
,
Leisenberger, F.
,
Schatzberger, G.
,
Carulli, J.
,
Siddhartha, S.
, and
Cheng, K. - T. Tim
,
“
Variation and Failure Characterization Through Pattern Classification of Test Data From Multiple Test Stages
”
, in
IEEE International Test Conference (ITC)
, 2016.
PDF:
itc16.pdf
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