Skip to main content
UCSB SoC Design and Test Lab
Search form
Search
Main menu
Home
Members
Publications
Courses
Current Projects
You are here
Home
An Artificial Neural Network Approach for Screening Test Escapes
Submitted by
Rui Wu
on Wed, 11/09/2016 - 22:02
F. Lin
and
Cheng, K. - T. Tim
,
“
An Artificial Neural Network Approach for Screening Test Escapes
”
,
Asia and South Pacific Design Automation Conference (ASP-DAC)
. Chiba/Tokyo, Japan, 2017.
PDF:
aspdac17.pdf
Google Scholar
BibTex