An Artificial Neural Network Approach for Screening Test Escapes

Submitted by Rui Wu on Wed, 11/09/2016 - 22:02
F. Lin and Cheng, K. - T. Tim, “An Artificial Neural Network Approach for Screening Test Escapes”, Asia and South Pacific Design Automation Conference (ASP-DAC). Chiba/Tokyo, Japan, 2017.
PDF: 
aspdac17.pdf