Taming Emerging Devices’ Variation and Reliability Challenges with Architectural and System Solutions

Y. Wang, Shao, L., Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Taming Emerging Devices’ Variation and Reliability Challenges with Architectural and System Solutions, in 32nd IEEE International Conference on Microelectronic Test Structures (Invited Paper), Kita-Kyushu City, Japan, 2019.