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Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy
Submitted by
superuser
on Mon, 04/06/2015 - 20:38
S. Shamshiri
and
Cheng, K. - T. Tim
,
“
Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy
”
, in
VLSI Test Symposium (VTS), 2010 28th
, 2010.
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