Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy

Submitted by superuser on Mon, 04/06/2015 - 20:38

S. Shamshiri and Cheng, K. - T. Tim, “Modeling yield, cost, and quality of an NoC with uniformly and non-uniformly distributed redundancy”, in VLSI Test Symposium (VTS), 2010 28th, 2010.