Calibration-assisted production testing for digitally-calibrated ADCs

Submitted by superuser on Mon, 04/06/2015 - 20:39

H. - M. Sherman Chang, Lin, K. - Y., and Cheng, K. - T. Tim, “Calibration-assisted production testing for digitally-calibrated ADCs”, in VLSI Test Symposium (VTS), 2010 28th, 2010.