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Calibration-assisted production testing for digitally-calibrated ADCs
Submitted by
superuser
on Mon, 04/06/2015 - 20:39
H. - M. Sherman Chang
,
Lin, K. - Y.
, and
Cheng, K. - T. Tim
,
“
Calibration-assisted production testing for digitally-calibrated ADCs
”
, in
VLSI Test Symposium (VTS), 2010 28th
, 2010.
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