Skip to main content
UCSB SoC Design and Test Lab
Search form
Search
Main menu
Home
Members
Publications
Courses
Current Projects
You are here
Home
Error-locality-aware linear coding to correct multi-bit upsets in SRAMs
Submitted by
superuser
on Mon, 04/06/2015 - 20:44
S. Shamshiri
and
Cheng, K. - T. Tim
,
“
Error-locality-aware linear coding to correct multi-bit upsets in SRAMs
”
, in
Test Conference (ITC), 2010 IEEE International
, 2010.
Google Scholar
BibTeX