Post-silicon Bug Detection for Variation Induced Electrical Bugs

Submitted by superuser on Mon, 04/06/2015 - 20:51
M. Gao, Lisherness, P., and Cheng, K. - T. Tim, “Post-silicon Bug Detection for Variation Induced Electrical Bugs”, in Proceedings of the 16th Asia and South Pacific Design Automation Conference, Piscataway, NJ, USA, 2011.