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Post-silicon Bug Detection for Variation Induced Electrical Bugs
Submitted by
superuser
on Mon, 04/06/2015 - 20:51
M. Gao
,
Lisherness, P.
, and
Cheng, K. - T. Tim
,
“
Post-silicon Bug Detection for Variation Induced Electrical Bugs
”
, in
Proceedings of the 16th Asia and South Pacific Design Automation Conference
, Piscataway, NJ, USA, 2011.
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