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Pseudo-functional scan-based bist for delay fault
Submitted by
superuser
on Mon, 04/06/2015 - 21:08
Y. - C. Lin
,
Lu, F.
, and
Cheng, K. - T. Tim
,
“
Pseudo-functional scan-based bist for delay fault
”
, in
VLSI Test Symposium, 2005. Proceedings. 23rd IEEE
, 2005, pp. 229–234.
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