Pseudo-functional scan-based bist for delay fault

Submitted by superuser on Mon, 04/06/2015 - 21:08
Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Pseudo-functional scan-based bist for delay fault”, in VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, 2005, pp. 229–234.