ChiYun compact: a novel test compaction technique for responses with unknown values
M. C. - T. Chao, Wang, S., Chakradhar, S. T., and Cheng, K. - T. Tim,
“ChiYun compact: a novel test compaction technique for responses with unknown values”, in
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.