ChiYun compact: a novel test compaction technique for responses with unknown values

Submitted by superuser on Mon, 04/06/2015 - 21:08

M. C. - T. Chao, Wang, S., Chakradhar, S. T., and Cheng, K. - T. Tim, “ChiYun compact: a novel test compaction technique for responses with unknown values”, in Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on, 2005, pp. 147–152.