Production-oriented interface testing for PCI-Express by enhanced loop-back technique

M. Lin, Cheng, K. - T. Tim, Hsu, J., Sun, M. C., Chen, J., and Lu, S., “Production-oriented interface testing for PCI-Express by enhanced loop-back technique”, in Test Conference, 2005. Proceedings. ITC 2005. IEEE International, 2005, p. 10–pp.