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A unified approach to test generation and test data volume reduction
Submitted by
superuser
on Mon, 04/06/2015 - 21:42
Y. - C. Lin
and
Cheng, K. - T. Tim
,
“
A unified approach to test generation and test data volume reduction
”
, in
Test Conference, 2006. ITC'06. IEEE International
, 2006.
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