Simulation-based functional test generation for embedded processors

Submitted by superuser on Mon, 04/06/2015 - 21:43
C. H. - P. Wen, Wang, L. C., and Cheng, K. - T. Tim, “Simulation-based functional test generation for embedded processors”, Computers, IEEE Transactions on, vol. 55, pp. 1335–1343, 2006.