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Simulation-based functional test generation for embedded processors
Submitted by
superuser
on Mon, 04/06/2015 - 21:43
C. H. - P. Wen
,
Wang, L. C.
, and
Cheng, K. - T. Tim
,
“
Simulation-based functional test generation for embedded processors
”
,
Computers, IEEE Transactions on
, vol. 55, pp. 1335–1343, 2006.
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