Multiple-fault diagnosis based on adaptive diagnostic test pattern generation

Submitted by superuser on Mon, 04/06/2015 - 21:46

Y. - C. Lin, Lu, F., and Cheng, K. - T. Tim, “Multiple-fault diagnosis based on adaptive diagnostic test pattern generation”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 26, pp. 932–942, 2007.