Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction

Submitted by superuser on Tue, 04/07/2015 - 00:14

S. Zhang, Lin, F., Hsu, C. - K., Cheng, K. - T. Tim, and Wang, H., “Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction”, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.