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Test-Quality Optimization for Variable n -Detections of Transition Faults
Submitted by
superuser
on Tue, 04/07/2015 - 00:15
D. Xu
,
Li, H.
,
Ghofrani, A.
,
Cheng, K. - T. Tim
,
Han, Y.
, and
Li, X.
,
“
Test-Quality Optimization for Variable n -Detections of Transition Faults
”
,
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
, vol. 22, pp. 1738-1749, 2014.
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