Test-Quality Optimization for Variable n -Detections of Transition Faults

D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., Test-Quality Optimization for Variable n -Detections of Transition Faults, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.