Test-Quality Optimization for Variable n -Detections of Transition Faults

Submitted by superuser on Tue, 04/07/2015 - 00:15

D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., “Test-Quality Optimization for Variable n -Detections of Transition Faults”, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.