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2016
A. Ghofrani, Lastras-Montano, M. Angel, Wang, Y., and Cheng, K. - T. Tim, In-place Repair for Resistive Memories Utilizing Complementary Resistive Switches, International Symposium on Low Power Electronics and Design (ISLPED). ACM, San Diego, CA, USA, 2016.
2015
A. Rahimi, Ghofrani, A., Cheng, K. - T. Tim, Benini, L., and Gupta, R. K., Approximate Associative Memristive Memory for Energy-Efficient GPUs, Design, Automation Test in Europe Conference Exhibition (DATE), 2015. DATE15-A2M2-CR.pdf (543.85 KB)
T. - C. Huang, Huang, J. - L., and Cheng, K. - T., Design, Automation, and Test for Low-Power and Reliable Flexible Electronics, Foundations and Trends in Electronic Design Automation, vol. 9, pp. 99-210, 2015.
N. Lesperance, Kulkarni, S., and Cheng, K. - T. Tim, Hardware Trojan Detection Using Exhaustive Testing of k-bit Subspaces, in Asia and South Pacific Design Automation Conference (ASP-DAC), 2015. ASPDAC2015.pdf (508.45 KB)
N. Fern, Kulkarni, S., and Cheng, K. - T. Tim, Hardware Trojans Hidden in RTL Don’t Cares – Automated Insertion and Prevention Methodologies, in International Test Conference (ITC), 2015. ITC15.pdf (278.4 KB)
M. Angel Lastras-Montano, Ghofrani, A., and Cheng, K. - T. Tim, HReRAM: A Hybrid Reconfigurable Resistive Random-Access Memory, Proceedings Design, Automation, and Test in Europe (DATE), IEEE, 2015. DATE15_1.pdf (5.59 MB)
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Toward Large-Scale Access-Transistor-Free Memristive Crossbars, in Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific, 2015. ASPDAC_invited.pdf (3.38 MB)
2014
D. Xiang, Sui, W., Yin, B., and Cheng, K. - T. Tim, Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1968-1979, 2014.
A. Rahimi, Ghofrani, A., Lastras-Montano, M. Angel, Cheng, K. - T. Tim, Benini, L., and Gupta, R. K., Energy-efficient GPGPU architectures via collaborative compilation and memristive memory-based computing, in Design Automation Conference (DAC), 2014 51st ACM/EDAC/IEEE, 2014. DAC14-memristor.pdf (1.69 MB)
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Feature engineering with canonical analysis for effective statistical tests screening test escapes, in Test Conference (ITC), 2014 IEEE International, 2014. itc14.pdf (4.28 MB)
S. Zhang, Lin, F., Hsu, C. - K., Cheng, K. - T. Tim, and Wang, H., Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, Learning from Production Test Data: Correlation Exploration and Feature Engineering, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014. ats14.pdf (2.45 MB)
D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., Test-Quality Optimization for Variable n -Detections of Transition Faults, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.
J. Bovington, Wu, R., Cheng, K. - T. Tim, and Bowers, J. E., Thermal stress implications in athermal TiO2 waveguides on a silicon substrate, Optics Express, vol. 22, no. 1, pp. 661–666, 2014. OE14.pdf (1.08 MB)
2013
L. Gao, Merrikh-Bayat, F., Alibart, F., Guo, X., Hoskins, B. D., Cheng, K. - T. Tim, and Strukov, D. B., Digital-to-analog and analog-to-digital conversion with metal oxide memristors for ultra-low power computing, in Nanoscale Architectures (NANOARCH), 2013 IEEE/ACM International Symposium on, 2013.
H. - M. Chang Chang, Huang, J. - L., Kwai, D. - M., Cheng, K. - T. Tim, and Wu, C. - W., Low-cost error tolerance scheme for 3-D CMOS imagers, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 21, pp. 465–474, 2013.
P. Lisherness, Lesperance, N., and Cheng, K. - T. Tim, Mutation analysis with coverage discounting, in Design, Automation Test in Europe Conference (DATE), 2013. DATE13.pdf (167.64 KB)
J. Bovington, Wu, R., Cheng, K. - T. Tim, and Bowers, J. E., Role of thermal stress in athermal waveguide design using TiO2 waveguides on a silicon substrate, in Photonics Conference (IPC), IEEE, Seattle, WA, 2013. IPC_2013_final.pdf (215.82 KB)
C. - K. Hsu, Lin, F., Cheng, K. - T. Tim, Zhang, W., Li, X., Carulli, J. M., and Butler, K. M., Test data analytics - Exploring spatial and test-item correlations in production test data, in Test Conference (ITC), 2013 IEEE International, 2013.
A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Towards data reliable crossbar-based memristive memories, in Test Conference (ITC), 2013 IEEE International, 2013. ITC'13_CR.pdf (2.68 MB)

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