K.-T. Tim Cheng

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F. Lin, Hsu, C. - K., Busetto, A. Giovanni, and Cheng, K. - T. Tim, Pairwise Proximity-Based Features for Test Escape Screening, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015.PDF icon iccad15.pdf (792.61 KB)
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A. Ghofrani, Lastras-Montano, M. Angel, and Cheng, K. - T. Tim, Toward Large-Scale Access-Transistor-Free Memristive Crossbars, in Design Automation Conference (ASP-DAC), 2015 20th Asia and South Pacific, 2015.PDF icon ASPDAC_invited.pdf (3.38 MB)
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D. Xiang, Sui, W., Yin, B., and Cheng, K. - T. Tim, Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1968-1979, 2014.
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D. Xu, Li, H., Ghofrani, A., Cheng, K. - T. Tim, Han, Y., and Li, X., Test-Quality Optimization for Variable n -Detections of Transition Faults, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 22, pp. 1738-1749, 2014.
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H. - M. Chang Chang, Huang, J. - L., Kwai, D. - M., Cheng, K. - T. Tim, and Wu, C. - W., Low-cost error tolerance scheme for 3-D CMOS imagers, Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol. 21, pp. 465–474, 2013.
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P. Lisherness, Lesperance, N., and Cheng, K. - T. Tim, Mutation analysis with coverage discounting, in Design, Automation Test in Europe Conference (DATE), 2013.PDF icon DATE13.pdf (167.64 KB)
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P. Lisherness and Cheng, K. - T. Tim, Improving validation coverage metrics to account for limited observability, in Design Automation Conference (ASP-DAC), 2012 17th Asia and South Pacific, 2012.

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