Y. Wang, Shao, L., Lastras-Montano, M. Angel, and Cheng, K. - T. Tim,
“Taming Emerging Devices’ Variation and Reliability Challenges with Architectural and System Solutions”, in
32nd IEEE International Conference on Microelectronic Test Structures (Invited Paper), Kita-Kyushu City, Japan, 2019.
Invited-3-Cheng.pdf (522.21 KB)