Chun-Kai Hsu
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, “Variation and Failure Characterization Through Pattern Classification of Test Data From Multiple Test Stages”, in IEEE International Test Conference (ITC), 2016.
itc16.pdf (407.86 KB)
itc16.pdf (407.86 KB), “AdaTest: An Efficient Statistical Test Framework for Test Escape Screening”, in International Test Conference (ITC), Anaheim, CA, 2015. itc15.pdf (273 KB)
itc15.pdf (273 KB), “Pairwise Proximity-Based Features for Test Escape Screening”, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015. iccad15.pdf (792.61 KB)
iccad15.pdf (792.61 KB), “Feature engineering with canonical analysis for effective statistical tests screening test escapes”, in Test Conference (ITC), 2014 IEEE International, 2014. itc14.pdf (4.28 MB)
itc14.pdf (4.28 MB), “Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction”, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.
, “Learning from Production Test Data: Correlation Exploration and Feature Engineering”, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014. ats14.pdf (2.45 MB)
ats14.pdf (2.45 MB), “Test data analytics - Exploring spatial and test-item correlations in production test data”, in Test Conference (ITC), 2013 IEEE International, 2013.