Fan Lin

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Filters: Keyword is test time reduction and Author is Kwang-Ting Tim Cheng  [Clear All Filters]
F. Lin and Cheng, K. - T. Tim, An Artificial Neural Network Approach for Screening Test Escapes, Asia and South Pacific Design Automation Conference (ASP-DAC). Chiba/Tokyo, Japan, 2017.PDF icon aspdac17.pdf (810.67 KB)