Fan Lin

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Author [ Year(Asc)]
Filters: Author is Alberto Giovanni Busetto  [Clear All Filters]
2017
F. Lin and Cheng, K. - T. Tim, “An Artificial Neural Network Approach for Screening Test Escapes”, Asia and South Pacific Design Automation Conference (ASP-DAC). Chiba/Tokyo, Japan, 2017.PDF icon aspdac17.pdf (810.67 KB)
2015
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, “AdaTest: An Efficient Statistical Test Framework for Test Escape Screening”, in International Test Conference (ITC), Anaheim, CA, 2015.PDF icon itc15.pdf (273 KB)
F. Lin, Hsu, C. - K., Busetto, A. Giovanni, and Cheng, K. - T. Tim, “Pairwise Proximity-Based Features for Test Escape Screening”, in International Conference on Computer-Aided Design (ICCAD), Austin, TX, 2015.PDF icon iccad15.pdf (792.61 KB)
2014
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, “Feature engineering with canonical analysis for effective statistical tests screening test escapes”, in Test Conference (ITC), 2014 IEEE International, 2014.PDF icon itc14.pdf (4.28 MB)
S. Zhang, Lin, F., Hsu, C. - K., Cheng, K. - T. Tim, and Wang, H., “Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction”, in Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, 2014.
F. Lin, Hsu, C. - K., and Cheng, K. - T. Tim, “Learning from Production Test Data: Correlation Exploration and Feature Engineering”, in Test Symposium (ATS), 2014 IEEE 23rd Asian, 2014.PDF icon ats14.pdf (2.45 MB)
2013
C. - K. Hsu, Lin, F., Cheng, K. - T. Tim, Zhang, W., Li, X., Carulli, J. M., and Butler, K. M., “Test data analytics - Exploring spatial and test-item correlations in production test data”, in Test Conference (ITC), 2013 IEEE International, 2013.